Article : texte imprimé

Dynamic Responses of an Atomic Force Microscope Interacting With Samples

Jih-Lian, Ha, Auteur ; Rong-Fong, Fung, Auteur ; Yi-Chan, Chen |

Dans Transactions of the ASME . Journal of dynamic systems, measurement, and control (Vol. 127 N° 4, Décembre 2005)

The objective of this paper is to formulate the equations of motion and to analyze the vibrations of an atomic force microscope (AFM), which contains a piezoelectric rod coupling with a cantilever beam, and the tip mass interacting with samples.[...]

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