Auteur Jalili, Nader
Documents disponibles écrits par cet auteur (5)
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Jalili, Nader, Auteur ; Dadfarnia, Mohsen, Auteur ; Dawson, Darren, M., Auteur |The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The non-contact AFM offers[...]
Article : texte imprimé
Dadfarnia, Mohsen, Auteur ; Jalili, Nader, Auteur ; Xian, Bin ; Dawson, Darren, M. |A Lyapunov-based control strategy is proposed for the regulation of a Cartesian robot manipulator, which is modeled as a flexible cantilever beam with a translational base support. The beam (arm) cross-sectional area is assumed to be uniform and[...]
Article : texte imprimé
Amin Salehi-Khojin, Auteur ; Saeid Bashash, Auteur ; Jalili, Nader, Auteur |Piezoresponse force microscopy (PFM) is an atomic force microscopy-based approach utilized for measuring local properties of piezoelectric materials. The objective of this study is to propose a practical framework for simultaneous estimation of [...]
Article : texte imprimé
Saeid Bashash, Auteur ; Jalili, Nader, Auteur |A set of memory-based properties is employed in this paper for modeling multiple-path hysteresis response of piezoelectric actuators. These properties, namely, targeting turning points, curve alignment, and wiping-out effect, are applied in a li[...]
Article : texte imprimé
Jalili, Nader, Auteur ; Laxman Saggere, Auteur ; Arvind Raman, Auteur |Most of today's emerging nanotechnological applications such as nanoelectromechanical systems require comprehensive modeling, control and manipulation of objects, components and subsystems ranging in sizes from few nanometers to micrometers. An [...]
