| Titre : | Sensing current and forces with SPM (2011) |
| Auteurs : | Jeong Y. Park, Auteur ; Sabine Maier, Auteur ; Bas Hendriksen, Auteur |
| Type de document : | Article : texte imprimé |
| Dans : | Materials today (Vol. 13 N° 10, Octobre 2010) |
| Article en page(s) : | pp. 38-45 |
| Note générale : | Ingénierie |
| Langues : | Anglais |
| Index. décimale : | 620 (Essais des matériaux. Matériaux commerciaux. Station génératrice d'énergie. Economie de l'énergie) |
| Tags : | Microscopy Atomic force Detection of currents Material properties |
| Résumé : |
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.
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| DEWEY : | 620 |
| ISSN : | 1369-7021 |
| En ligne : | http://www.sciencedirect.com/science/article/pii/S1369702110701851 |
