|
Titre :
|
Seeing graphene-based sheets (2010)
|
|
Auteurs :
|
Jaemyung Kim, Auteur ;
Franklin Kim, Auteur ;
Jiaxing Huang, Auteur
|
|
Type de document :
|
Article : texte imprimé
|
|
Dans :
|
Materials today (Vol. 13 N° 3, Mars 2010)
|
|
Article en page(s) :
|
pp. 28–38
|
|
Note générale :
|
Ingénierie
|
|
Langues :
|
Anglais
|
|
Index. décimale :
|
620 (Essais des matériaux. Matériaux commerciaux. Station génératrice d'énergie. Economie de l'énergie)
|
|
Tags :
|
Graphene Atomic layers oxide Imaging techniques Electron microscopy
|
|
Résumé :
|
Graphene-based sheets such as graphene, graphene oxide and reduced graphene oxide have stimulated great interest due to their promising electronic, mechanical and thermal properties. Microscopy imaging is indispensable for characterizing these single atomic layers, and oftentimes is the first measure of sample quality. This review provides an overview of current imaging techniques for graphene-based sheets and highlights a recently developed fluorescence quenching microscopy technique that allows high-throughput, high-contrast imaging of graphene-based sheets on arbitrary substrate and even in solution.
|
|
DEWEY :
|
620
|
|
ISSN :
|
1369-7021
|
|
En ligne :
|
http://www.sciencedirect.com/science/article/pii/S1369702110700316
|
