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Détail de l'auteur
Auteur Akilimali, Jean Sumaili
Documents disponibles écrits par cet auteur
Affiner la rechercheAre manufacturing I – V mismatch and reverse currents key factors in large photovoltaic arrays? / Spertino, Filippo in IEEE transactions on industrial electronics, Vol. 56 N° 11 (Novembre 2009)
[article]
in IEEE transactions on industrial electronics > Vol. 56 N° 11 (Novembre 2009) . - pp. 4520 - 4531
Titre : Are manufacturing I – V mismatch and reverse currents key factors in large photovoltaic arrays? Type de document : texte imprimé Auteurs : Spertino, Filippo, Auteur ; Akilimali, Jean Sumaili, Auteur Article en page(s) : pp. 4520 - 4531 Note générale : Génie électrique Langues : Anglais (eng) Mots-clés : Blocking diodes Equivalent-circuit parameters Manufacturing I-V mismatch Photovoltaic (PV) arrays PV module Reverse current Index. décimale : 621.38 Dispositifs électroniques. Tubes à électrons. Photocellules. Accélérateurs de particules. Tubes à rayons X Résumé : In this paper, two factors typical of large photovoltaic (PV) arrays are investigated: one is the current-voltage (I-V) mismatch consequent to the production tolerance; the other is the impact of reverse currents in different operating conditions. Concerning the manufacturing I-V mismatch, the parameters of the equivalent circuit of the solar cell are computed for several PV modules from flash reports provided by the manufacturers. The corresponding I-V characteristic of every module is used to evaluate the behavior of different strings and the interaction among the strings connected for composing PV arrays. Two real crystalline silicon PV systems of 8 times 250 kW and 20 kW are studied, respectively. The simulation results reveal that the impact of the I-V mismatch is negligible with the usual tolerance, and the insertion of the blocking diodes against reverse currents can be avoided with crystalline silicon technology. On the other hand, the experimental results on I-V characteristics of the aforementioned arrays put into evidence the existence of a remarkable power deviation (3%-4%) with respect to the rated power, linkable to the lack of measurement uncertainty in the manufacturer flash reports. DEWEY : 621.38 ISSN : 0278-0046 En ligne : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5129957 [article] Are manufacturing I – V mismatch and reverse currents key factors in large photovoltaic arrays? [texte imprimé] / Spertino, Filippo, Auteur ; Akilimali, Jean Sumaili, Auteur . - pp. 4520 - 4531.
Génie électrique
Langues : Anglais (eng)
in IEEE transactions on industrial electronics > Vol. 56 N° 11 (Novembre 2009) . - pp. 4520 - 4531
Mots-clés : Blocking diodes Equivalent-circuit parameters Manufacturing I-V mismatch Photovoltaic (PV) arrays PV module Reverse current Index. décimale : 621.38 Dispositifs électroniques. Tubes à électrons. Photocellules. Accélérateurs de particules. Tubes à rayons X Résumé : In this paper, two factors typical of large photovoltaic (PV) arrays are investigated: one is the current-voltage (I-V) mismatch consequent to the production tolerance; the other is the impact of reverse currents in different operating conditions. Concerning the manufacturing I-V mismatch, the parameters of the equivalent circuit of the solar cell are computed for several PV modules from flash reports provided by the manufacturers. The corresponding I-V characteristic of every module is used to evaluate the behavior of different strings and the interaction among the strings connected for composing PV arrays. Two real crystalline silicon PV systems of 8 times 250 kW and 20 kW are studied, respectively. The simulation results reveal that the impact of the I-V mismatch is negligible with the usual tolerance, and the insertion of the blocking diodes against reverse currents can be avoided with crystalline silicon technology. On the other hand, the experimental results on I-V characteristics of the aforementioned arrays put into evidence the existence of a remarkable power deviation (3%-4%) with respect to the rated power, linkable to the lack of measurement uncertainty in the manufacturer flash reports. DEWEY : 621.38 ISSN : 0278-0046 En ligne : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5129957