Documents disponibles écrits par cet auteur

Electrical resistivity and hydrogen solubility of PdHc thin films / Stefan Wagner in Acta materialia, Vol. 58 N° 4 (Fevrier 2010) 

Public ISBD [article]  in Acta materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1387–1394 Titre : Electrical resistivity and hydrogen solubility of PdHc thin films Type de document : texte imprimé Auteurs : Stefan Wagner, Auteur ; Astrid Pundt, Auteur Année de publication : 2011 Article en page(s) : pp. 1387–1394 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : Hydrogen  Pd  thin  films  Resistivity  Stress  Buckling Résumé : During hydrogen gas loading, Pd thin films exhibit an anomalous reduction of resistivity change with decreasing film thickness. In this paper we show that this effect can mainly be attributed to a stress-dependent reduction of hydrogen solubility at a given hydrogen pressure. Different stress states of the thin films result from different bonding to a rigid substrate. Strongly buckled thin films show bulk-like pressure–resistivity isotherms. The resistivity changes as a function of hydrogen concentration appear to be independent of film thickness. The apparent Sieverts’ constant seems to be larger for thin films compared to bulk, and increases with cycling of the thin films. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007484 [article] Electrical resistivity and hydrogen solubility of PdHc thin films [texte imprimé] / Stefan Wagner, Auteur ; Astrid Pundt, Auteur . - 2011 . - pp. 1387–1394. Métallurgie Langues : Anglais (eng) in Acta materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1387–1394 Mots-clés : Hydrogen  Pd  thin  films  Resistivity  Stress  Buckling Résumé : During hydrogen gas loading, Pd thin films exhibit an anomalous reduction of resistivity change with decreasing film thickness. In this paper we show that this effect can mainly be attributed to a stress-dependent reduction of hydrogen solubility at a given hydrogen pressure. Different stress states of the thin films result from different bonding to a rigid substrate. Strongly buckled thin films show bulk-like pressure–resistivity isotherms. The resistivity changes as a function of hydrogen concentration appear to be independent of film thickness. The apparent Sieverts’ constant seems to be larger for thin films compared to bulk, and increases with cycling of the thin films. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007484

The duration of patent examination at the European Patent Office / Dietmar Harhoff in Management science, Vol. 55 N° 12 (Décembre 2009) 

Public ISBD [article]  in Management science > Vol. 55 N° 12 (Décembre 2009) . - pp. 1969-1984 Titre : The duration of patent examination at the European Patent Office Type de document : texte imprimé Auteurs : Dietmar Harhoff, Auteur ; Stefan Wagner, Auteur Article en page(s) : pp. 1969-1984 Note générale : Gestion Langues : Anglais (eng) Mots-clés : Patents  Patent  examination  Survival  analysis  Patent  citations  European  Patent  Office Index. décimale : 658 Organisation des entreprises. Techniques du commerce Résumé : We analyze the duration and outcomes of patent examination at the European Patent Office utilizing an unusually rich data set covering a random sample of 215,265 applications filed between 1982 and 1998. In our empirical analysis, we distinguish between three groups of determinants: applicant characteristics, indicators of patent quality and value, and determinants that affect the complexity of the examination task. The results from an accelerated failure time model indicate that more controversial claims lead to slower grants but faster withdrawals, whereas well-documented applications are approved faster and withdrawn more slowly. We find strong evidence that applicants accelerate grant proceedings for their most valuable patents, but that they also prolong the battle for such patents if a withdrawal or refusal is imminent. This paper develops implications of these results for managerial decision making in research and development and innovation management. DEWEY : 658 ISSN : 0025-1909 En ligne : http://mansci.journal.informs.org/cgi/content/abstract/55/12/1969?maxtoshow=&hit [...] [article] The duration of patent examination at the European Patent Office [texte imprimé] / Dietmar Harhoff, Auteur ; Stefan Wagner, Auteur . - pp. 1969-1984. Gestion Langues : Anglais (eng) in Management science > Vol. 55 N° 12 (Décembre 2009) . - pp. 1969-1984 Mots-clés : Patents  Patent  examination  Survival  analysis  Patent  citations  European  Patent  Office Index. décimale : 658 Organisation des entreprises. Techniques du commerce Résumé : We analyze the duration and outcomes of patent examination at the European Patent Office utilizing an unusually rich data set covering a random sample of 215,265 applications filed between 1982 and 1998. In our empirical analysis, we distinguish between three groups of determinants: applicant characteristics, indicators of patent quality and value, and determinants that affect the complexity of the examination task. The results from an accelerated failure time model indicate that more controversial claims lead to slower grants but faster withdrawals, whereas well-documented applications are approved faster and withdrawn more slowly. We find strong evidence that applicants accelerate grant proceedings for their most valuable patents, but that they also prolong the battle for such patents if a withdrawal or refusal is imminent. This paper develops implications of these results for managerial decision making in research and development and innovation management. DEWEY : 658 ISSN : 0025-1909 En ligne : http://mansci.journal.informs.org/cgi/content/abstract/55/12/1969?maxtoshow=&hit [...]