Auteur J. Wang
Documents disponibles écrits par cet auteur (7)
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J. Wang, Auteur ; N. Li, Auteur ; O. Anderoglu, Auteur |Using in situ transmission electron microscopy, we studied the stability of growth twins. We observed the rapid migration of incoherent twin boundaries (ITBs), indicating that nanotwins are unstable. Topological analysis and atomistic simulation[...]
Article : texte imprimé
J. Wang, Auteur ; L. Lin Cao, Auteur ; H. Yan Wu, Auteur |A novel Structure Approaching Hybrid Neural Network (SAHNN) approach to model batch reactors is presented. The Virtual Supervisor-Artificial Immune Algorithm method is utilized for the training of SAHNN, especially for the batch processes with p[...]
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Phosphating is a widely adopted treatment in industry for many purposes. In this paper, carbon steel was pretreated with sodium silicate before phosphating. X-ray diffraction (XRD), scanning electron microscopy (SEM), and electrochemical measure[...]
Article : texte imprimé
J. Wang, Auteur ; L. W. Wang, Auteur ; W. L. Luo, Auteur |A novel two-stage adsorption freezing machine, which is powered by the heat source with the temperature below 100 °C was developed. The composite adsorbents of CaCl2 and BaCl2 developed by the matrix of expanded natural graphite were chosen as a[...]
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The influences of a single bump (dent) or regularly arranged bumps (dents) on the film thickness in impact circular elasthydrodynamic lubrication (EHL) contacts lubricated with a Newtonian lubricant are investigated numerically. It has been foun[...]
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Immersion tests were carried out in high temperature lead-containing caustic solution in a static autoclave. The results showed samples with three surface statuses of Alloy 690 TT suffered from intergranular attack (IGA) after immersion in 10% s[...]
Article : texte imprimé
In this paper, a parameter, named as the changing rate of impedance (CRI) derived from electrochemical impedance spectroscopy (EIS) data was selected. The deterioration process of organic coating was investigated by analyzing this parameter usin[...]
