Hierarchically distributed fault detection and identification through dempster–shafer evidence fusion / Kaushik Ghosh in Industrial & engineering chemistry research, Vol. 50 N° 15 (Août 2011)  

Public ISBD [article]  inIndustrial & engineering chemistry research > Vol. 50 N° 15 (Août 2011) . - pp. 9249-9269 Titre : Hierarchically distributed fault detection and identification through dempster–shafer evidence fusion Type de document : texte imprimé Auteurs : Kaushik Ghosh, Auteur ; Sathish Natarajan, Auteur ; Rajagopalan Srinivasan, Auteur Année de publication : 2011 Article en page(s) : pp. 9249-9269 Note générale : Chimie industrielle Langues : Anglais (eng) Mots-clés : Failure detection Résumé : Due to the sheer size and complexity of modem chemical processes, single centralized monolithic monitoring strategies are not always well suited for detecting and identifying faults. In this paper, we propose a framework for distributed fault detection and identification (FDI), wherein the process is decomposed hierarchically into sections and subsections based on a process flow diagram. Multiple hierarchical FDI methods at varying levels of granularity are deployed to monitor the various sections and subsections of the process. The results from the individual FDI methods contain mutually nonexclusive fault classes at different levels of granularity. We propose an adaptation of the Dempster-Shafer evidence theory to combine these diagnostic results at different levels of abstraction. The key benefits of this scheme as demonstrated through two case studies-a simulated CSTR-distillation column system and the Tennessee Eastman challenge process-are improved diagnostic performance compared to individual FDI methods, robust localization of even novel faults, and a coherent explanation of the entire plant's state. DEWEY : 660 ISSN : 0888-5885 En ligne : http://cat.inist.fr/?aModele=afficheN&cpsidt=24395870 [article] Hierarchically distributed fault detection and identification through dempster–shafer evidence fusion [texte imprimé] / Kaushik Ghosh, Auteur ; Sathish Natarajan, Auteur ; Rajagopalan Srinivasan, Auteur . - 2011 . - pp. 9249-9269. Chimie industrielle Langues : Anglais (eng) in Industrial & engineering chemistry research > Vol. 50 N° 15 (Août 2011) . - pp. 9249-9269 Mots-clés : Failure detection Résumé : Due to the sheer size and complexity of modem chemical processes, single centralized monolithic monitoring strategies are not always well suited for detecting and identifying faults. In this paper, we propose a framework for distributed fault detection and identification (FDI), wherein the process is decomposed hierarchically into sections and subsections based on a process flow diagram. Multiple hierarchical FDI methods at varying levels of granularity are deployed to monitor the various sections and subsections of the process. The results from the individual FDI methods contain mutually nonexclusive fault classes at different levels of granularity. We propose an adaptation of the Dempster-Shafer evidence theory to combine these diagnostic results at different levels of abstraction. The key benefits of this scheme as demonstrated through two case studies-a simulated CSTR-distillation column system and the Tennessee Eastman challenge process-are improved diagnostic performance compared to individual FDI methods, robust localization of even novel faults, and a coherent explanation of the entire plant's state. DEWEY : 660 ISSN : 0888-5885 En ligne : http://cat.inist.fr/?aModele=afficheN&cpsidt=24395870

Exemplaires

Code-barres	Cote	Support	Localisation	Section	Disponibilité
aucun exemplaire