Article : texte imprimé

Wide-field SEM of semiconducting minerals

James C. Weaver, Auteur ; William Mershon, Auteur ; Martin Zadrazil, Auteur |

Dans Materials today (Vol. 13 N° 10, Octobre 2010)

There has been significant progress in recent years aimed at pushing the spatial resolution limits of scanning electron microscopes. Many of these endeavours have been driven by advances in the field of nanotechnology and the need to investigate[...]

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