Les Inscriptions à la Bibliothèque sont ouvertes en
ligne via le site: https://biblio.enp.edu.dz
Les Réinscriptions se font à :
• La Bibliothèque Annexe pour les étudiants en
2ème Année CPST
• La Bibliothèque Centrale pour les étudiants en Spécialités
A partir de cette page vous pouvez :
Retourner au premier écran avec les recherches... |
Détail de l'auteur
Auteur N. Joshi
Documents disponibles écrits par cet auteur
Affiner la rechercheA model of contact with adhesion of a layered elastic-plastic microsphere with a rigid flat surface / H. Eid in Transactions of the ASME . Journal of tribology, Vol. 133 N° 3 (Juillet 2011)
[article]
in Transactions of the ASME . Journal of tribology > Vol. 133 N° 3 (Juillet 2011) . - 05 p.
Titre : A model of contact with adhesion of a layered elastic-plastic microsphere with a rigid flat surface Type de document : texte imprimé Auteurs : H. Eid, Auteur ; N. Joshi, Auteur ; N. E. McGruer, Auteur Année de publication : 2012 Article en page(s) : 05 p. Note générale : Tribology Langues : Anglais (eng) Mots-clés : Adhesion Adhesives Contact resistance Durability Elasticity Finite element analysis Inclusions Interference Lennard-Jones potential Plasticity Ruthenium Index. décimale : 621.5 Energie pneumatique. Machinerie et outils. Réfrigération Résumé : A finite element model of a layered hemisphere contacting a rigid flat, which includes the effect of adhesion, is developed. In this analysis elastic-plastic material properties were used for each of the materials comprising the layered hemisphere. The inclusion of the effect of adhesion, which was accomplished with the Lennard-Jones potential, required a special procedure. This configuration is of general theoretical interest in the understanding of adhesion. It has also been suggested as a possible design for a microswitch contact because, with an appropriate choice of metals, it has the potential to achieve low adhesion, low contact resistance, and high durability. The effect of the layer thickness on the adhesive contact was investigated. In particular the influences of layer thickness on the pull-off force, maximum contact radius, and contact resistance were determined. The results are presented as load versus interference and contact radius versus interference for loading and unloading from different values of the maximum interference. DEWEY : 621.5 ISSN : 0742-4787 En ligne : http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JOTRE900013 [...] [article] A model of contact with adhesion of a layered elastic-plastic microsphere with a rigid flat surface [texte imprimé] / H. Eid, Auteur ; N. Joshi, Auteur ; N. E. McGruer, Auteur . - 2012 . - 05 p.
Tribology
Langues : Anglais (eng)
in Transactions of the ASME . Journal of tribology > Vol. 133 N° 3 (Juillet 2011) . - 05 p.
Mots-clés : Adhesion Adhesives Contact resistance Durability Elasticity Finite element analysis Inclusions Interference Lennard-Jones potential Plasticity Ruthenium Index. décimale : 621.5 Energie pneumatique. Machinerie et outils. Réfrigération Résumé : A finite element model of a layered hemisphere contacting a rigid flat, which includes the effect of adhesion, is developed. In this analysis elastic-plastic material properties were used for each of the materials comprising the layered hemisphere. The inclusion of the effect of adhesion, which was accomplished with the Lennard-Jones potential, required a special procedure. This configuration is of general theoretical interest in the understanding of adhesion. It has also been suggested as a possible design for a microswitch contact because, with an appropriate choice of metals, it has the potential to achieve low adhesion, low contact resistance, and high durability. The effect of the layer thickness on the adhesive contact was investigated. In particular the influences of layer thickness on the pull-off force, maximum contact radius, and contact resistance were determined. The results are presented as load versus interference and contact radius versus interference for loading and unloading from different values of the maximum interference. DEWEY : 621.5 ISSN : 0742-4787 En ligne : http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JOTRE900013 [...]