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Synchrotron XPS, NEXAFS, and ToF-SIMS studies of solution exposed chalcopyrite and heterogeneous chalcopyrite with pyrite

Robert G. Acres, Auteur ; Sarah L. Harmer, Auteur ; David A. Beattie, Auteur |

Dans Minerals engineering (Vol. 23 N° 11-13, Octobre 2010)

The surface species present on two pure chalcopyrite samples (one with a smooth fracture surface; one with a rough fracture surface) and one heterogeneous sample containing both chalcopyrite and pyrite have been studied using synchrotron X-ray p[...]

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