Fabrication, structure and mechanical properties of indium nanopillars / Gyuhyon Lee in Acta materialia, Vol. 58 N° 4 (Fevrier 2010)  

Public ISBD [article]  inActa materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1361–1368 Titre : Fabrication, structure and mechanical properties of indium nanopillars Type de document : texte imprimé Auteurs : Gyuhyon Lee, Auteur ; Ju-Young Kim, Auteur ; Arief Suriadi Budiman, Auteur Année de publication : 2011 Article en page(s) : pp. 1361–1368 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : Plastic deformation X-ray diffraction Compression test Electroplating Yield phenomena Résumé : Solid and hollow cylindrical indium pillars with nanoscale diameters were prepared using electron beam lithography followed by the electroplating fabrication method. The microstructure of the solid-core indium pillars was characterized by scanning micro-X-ray diffraction, which shows that the indium pillars were annealed at room temperature with very few dislocations remaining in the samples. The mechanical properties of the solid pillars were characterized using a uniaxial microcompression technique, which demonstrated that the engineering yield stress is ∼9 times greater than bulk and is ∼1/28 of the indium shear modulus, suggesting that the attained stresses are close to theoretical strength. Microcompression of hollow indium nanopillars showed evidence of brittle fracture. This may suggest that the failure mode for one of the most ductile metals can become brittle when the feature size is sufficiently small. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007459 [article] Fabrication, structure and mechanical properties of indium nanopillars [texte imprimé] / Gyuhyon Lee, Auteur ; Ju-Young Kim, Auteur ; Arief Suriadi Budiman, Auteur . - 2011 . - pp. 1361–1368. Métallurgie Langues : Anglais (eng) in Acta materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1361–1368 Mots-clés : Plastic deformation X-ray diffraction Compression test Electroplating Yield phenomena Résumé : Solid and hollow cylindrical indium pillars with nanoscale diameters were prepared using electron beam lithography followed by the electroplating fabrication method. The microstructure of the solid-core indium pillars was characterized by scanning micro-X-ray diffraction, which shows that the indium pillars were annealed at room temperature with very few dislocations remaining in the samples. The mechanical properties of the solid pillars were characterized using a uniaxial microcompression technique, which demonstrated that the engineering yield stress is ∼9 times greater than bulk and is ∼1/28 of the indium shear modulus, suggesting that the attained stresses are close to theoretical strength. Microcompression of hollow indium nanopillars showed evidence of brittle fracture. This may suggest that the failure mode for one of the most ductile metals can become brittle when the feature size is sufficiently small. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007459

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