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Electrical resistivity and hydrogen solubility of PdHc thin films / Stefan Wagner in Acta materialia, Vol. 58 N° 4 (Fevrier 2010) 

Public ISBD [article]  in Acta materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1387–1394 Titre : Electrical resistivity and hydrogen solubility of PdHc thin films Type de document : texte imprimé Auteurs : Stefan Wagner, Auteur ; Astrid Pundt, Auteur Année de publication : 2011 Article en page(s) : pp. 1387–1394 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : Hydrogen  Pd  thin  films  Resistivity  Stress  Buckling Résumé : During hydrogen gas loading, Pd thin films exhibit an anomalous reduction of resistivity change with decreasing film thickness. In this paper we show that this effect can mainly be attributed to a stress-dependent reduction of hydrogen solubility at a given hydrogen pressure. Different stress states of the thin films result from different bonding to a rigid substrate. Strongly buckled thin films show bulk-like pressure–resistivity isotherms. The resistivity changes as a function of hydrogen concentration appear to be independent of film thickness. The apparent Sieverts’ constant seems to be larger for thin films compared to bulk, and increases with cycling of the thin films. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007484 [article] Electrical resistivity and hydrogen solubility of PdHc thin films [texte imprimé] / Stefan Wagner, Auteur ; Astrid Pundt, Auteur . - 2011 . - pp. 1387–1394. Métallurgie Langues : Anglais (eng) in Acta materialia > Vol. 58 N° 4 (Fevrier 2010) . - pp. 1387–1394 Mots-clés : Hydrogen  Pd  thin  films  Resistivity  Stress  Buckling Résumé : During hydrogen gas loading, Pd thin films exhibit an anomalous reduction of resistivity change with decreasing film thickness. In this paper we show that this effect can mainly be attributed to a stress-dependent reduction of hydrogen solubility at a given hydrogen pressure. Different stress states of the thin films result from different bonding to a rigid substrate. Strongly buckled thin films show bulk-like pressure–resistivity isotherms. The resistivity changes as a function of hydrogen concentration appear to be independent of film thickness. The apparent Sieverts’ constant seems to be larger for thin films compared to bulk, and increases with cycling of the thin films. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409007484