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Détail de l'auteur
Auteur Eralp Demir
Documents disponibles écrits par cet auteur
Affiner la rechercheThe mechanical size effect as a mean-field breakdown phenomenon / Eralp Demir in Acta materialia, Vol. 58 N° 5 (Mars 2010)
[article]
in Acta materialia > Vol. 58 N° 5 (Mars 2010) . - pp. 1876–1886
Titre : The mechanical size effect as a mean-field breakdown phenomenon : Example of microscale single crystal beam bending Type de document : texte imprimé Auteurs : Eralp Demir, Auteur ; Dierk Raabe, Auteur ; Franz Roters, Auteur Année de publication : 2011 Article en page(s) : pp. 1876–1886 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : Size effect Electron backscattering diffraction (EBSD) Bending Copper Crystal plasticity Résumé : Single crystalline copper beams with thicknesses between 0.7 and 5 μm are manufactured with a focused ion beam technique and bent in a nanoindenter. The yield strengths of the beams show a mechanical size effect (smaller-is-stronger). The geometrically necessary dislocation (GND) densities estimated from misorientation maps do not explain the observed size effect. Also, accumulation of GNDs principally requires pre-straining. We hence introduce a mean-field breakdown theory and generalize it to small-scale mechanical tests other than bending. The mean-field breakdown limit is defined in terms of a microstructural correlation measure (characteristic dislocation bow-out length) below which the local availability of dislocation sources and not the density of GNDs dominates the mechanical size effect. This explains why a size dependence can occur for samples that are not pre-strained (by using a very small critical strain to define the yield strength). After pre-straining, when GNDs build up, they can contribute to the flow stress. The mean-field breakdown theory can also explain the large scatter typically observed in small-scale mechanical tests as the availability of sufficiently soft sources at scales around or below the correlation length does not follow statistical laws but highly depends on the position where the probe is taken. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409008106 [article] The mechanical size effect as a mean-field breakdown phenomenon : Example of microscale single crystal beam bending [texte imprimé] / Eralp Demir, Auteur ; Dierk Raabe, Auteur ; Franz Roters, Auteur . - 2011 . - pp. 1876–1886.
Métallurgie
Langues : Anglais (eng)
in Acta materialia > Vol. 58 N° 5 (Mars 2010) . - pp. 1876–1886
Mots-clés : Size effect Electron backscattering diffraction (EBSD) Bending Copper Crystal plasticity Résumé : Single crystalline copper beams with thicknesses between 0.7 and 5 μm are manufactured with a focused ion beam technique and bent in a nanoindenter. The yield strengths of the beams show a mechanical size effect (smaller-is-stronger). The geometrically necessary dislocation (GND) densities estimated from misorientation maps do not explain the observed size effect. Also, accumulation of GNDs principally requires pre-straining. We hence introduce a mean-field breakdown theory and generalize it to small-scale mechanical tests other than bending. The mean-field breakdown limit is defined in terms of a microstructural correlation measure (characteristic dislocation bow-out length) below which the local availability of dislocation sources and not the density of GNDs dominates the mechanical size effect. This explains why a size dependence can occur for samples that are not pre-strained (by using a very small critical strain to define the yield strength). After pre-straining, when GNDs build up, they can contribute to the flow stress. The mean-field breakdown theory can also explain the large scatter typically observed in small-scale mechanical tests as the availability of sufficiently soft sources at scales around or below the correlation length does not follow statistical laws but highly depends on the position where the probe is taken. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645409008106