[article]
Titre : |
Experimental and computational study on the effect of yttrium on the phase stability of sputtered Cr–Al–Y–N hard coatings |
Type de document : |
texte imprimé |
Auteurs : |
F. Rovere, Auteur ; D. Music, Auteur ; J.M. Schneider, Auteur |
Année de publication : |
2011 |
Article en page(s) : |
pp. 2708–2715 |
Note générale : |
Métallurgie |
Langues : |
Anglais (eng) |
Mots-clés : |
CrAlN Phase stability Ab initio OpenMX |
Résumé : |
The effect of Y incorporation into cubic Cr–Al–N (B1) was studied using ab initio calculations, X-ray diffraction and energy-dispersive X-ray analysis of sputtered quaternary nitride films. The data obtained indicate that the Y incorporation shifts the critical Al content, where the hexagonal (B4) structure is stable, to lower values. The calculated critical Al contents of x ≈ 0.75 for Cr1−xAlxN and x ≈ 0.625 for Cr1−x−yAlxYyN with y = 0.125 are consistent with experimentally obtained values of x = 0.69 for Cr1−xAlxN and x = 0.68 and 0.61 for Cr1−x−yAlxYyN with y = 0.02 and 0.06, respectively. This may be understood based on the electronic structure. Both Cr and Al can randomly be substituted by Y. The substitution of Cr by Y increases the phase stability due to depletion of non-bonding (anti-bonding) states, while the substitution of Al by Y decreases the phase stability mainly due to lattice strain. |
DEWEY : |
669 |
ISSN : |
1359-6454 |
En ligne : |
http://www.sciencedirect.com/science/article/pii/S135964541000008X |
in Acta materialia > Vol. 58 N° 7 (Avril 2010) . - pp. 2708–2715
[article] Experimental and computational study on the effect of yttrium on the phase stability of sputtered Cr–Al–Y–N hard coatings [texte imprimé] / F. Rovere, Auteur ; D. Music, Auteur ; J.M. Schneider, Auteur . - 2011 . - pp. 2708–2715. Métallurgie Langues : Anglais ( eng) in Acta materialia > Vol. 58 N° 7 (Avril 2010) . - pp. 2708–2715
Mots-clés : |
CrAlN Phase stability Ab initio OpenMX |
Résumé : |
The effect of Y incorporation into cubic Cr–Al–N (B1) was studied using ab initio calculations, X-ray diffraction and energy-dispersive X-ray analysis of sputtered quaternary nitride films. The data obtained indicate that the Y incorporation shifts the critical Al content, where the hexagonal (B4) structure is stable, to lower values. The calculated critical Al contents of x ≈ 0.75 for Cr1−xAlxN and x ≈ 0.625 for Cr1−x−yAlxYyN with y = 0.125 are consistent with experimentally obtained values of x = 0.69 for Cr1−xAlxN and x = 0.68 and 0.61 for Cr1−x−yAlxYyN with y = 0.02 and 0.06, respectively. This may be understood based on the electronic structure. Both Cr and Al can randomly be substituted by Y. The substitution of Cr by Y increases the phase stability due to depletion of non-bonding (anti-bonding) states, while the substitution of Al by Y decreases the phase stability mainly due to lattice strain. |
DEWEY : |
669 |
ISSN : |
1359-6454 |
En ligne : |
http://www.sciencedirect.com/science/article/pii/S135964541000008X |
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