Auteur L.C. De Jonghe
Documents disponibles écrits par cet auteur (1)
Affiner la recherche
Article : texte imprimé
Atomic-scale imaging and the effect of yttrium on the fracture toughness of silicon carbide ceramics
A.M. Kueck, Auteur ; Q.M. Ramasse, Auteur ; L.C. De Jonghe, Auteur |In SiC sintered with Al, B and C additions (ABC–SiC), the presence of Y in the Al–Si–O–C grain-boundary phase leads to less frequent crack deflection and lower toughness. When Y is absent from the grain-boundary phase and remains in the triple p[...]
