[article]
Titre : |
Microband evolution during large plastic strains of stable {1 1 0}〈1 1 2〉 Al and Al–Mn crystals |
Type de document : |
texte imprimé |
Auteurs : |
A. Albou, Auteur ; J.H. Driver, Auteur ; C. Maurice, Auteur |
Année de publication : |
2011 |
Article en page(s) : |
pp. 3022–3034 |
Note générale : |
Métallurgie |
Langues : |
Anglais (eng) |
Mots-clés : |
Microstructure Microbands Disorientation EBSD Aluminium |
Résumé : |
The deformation microstructures of Al and Al–Mn {1 1 0}〈1 1 2〉 single crystals have been characterized after room temperature channel-die compression up to true strains of 2.1. The evolution of local misorientations and microband structures were quantified by high-resolution electron backscatter diffraction in a field emission gun scanning electron microscope and their alignments compared with the traces of active slip planes and macroscopic shear stress planes. During plane-strain compression these “Brass” oriented crystals remain stable in terms of the final, average, orientation, with a small orientation spread. However, the microband alignment varies with strain and also with solute content. There is a general tendency for the microbands to be both crystallographic and non-crystallographic at low strains, then crystallographic, and finally mixed again at high strains (with some lamellar banding). |
DEWEY : |
669 |
ISSN : |
1359-6454 |
En ligne : |
http://www.sciencedirect.com/science/article/pii/S1359645410000480 |
in Acta materialia > Vol. 58 N° 8 (Mai 2010) . - pp. 3022–3034
[article] Microband evolution during large plastic strains of stable {1 1 0}〈1 1 2〉 Al and Al–Mn crystals [texte imprimé] / A. Albou, Auteur ; J.H. Driver, Auteur ; C. Maurice, Auteur . - 2011 . - pp. 3022–3034. Métallurgie Langues : Anglais ( eng) in Acta materialia > Vol. 58 N° 8 (Mai 2010) . - pp. 3022–3034
Mots-clés : |
Microstructure Microbands Disorientation EBSD Aluminium |
Résumé : |
The deformation microstructures of Al and Al–Mn {1 1 0}〈1 1 2〉 single crystals have been characterized after room temperature channel-die compression up to true strains of 2.1. The evolution of local misorientations and microband structures were quantified by high-resolution electron backscatter diffraction in a field emission gun scanning electron microscope and their alignments compared with the traces of active slip planes and macroscopic shear stress planes. During plane-strain compression these “Brass” oriented crystals remain stable in terms of the final, average, orientation, with a small orientation spread. However, the microband alignment varies with strain and also with solute content. There is a general tendency for the microbands to be both crystallographic and non-crystallographic at low strains, then crystallographic, and finally mixed again at high strains (with some lamellar banding). |
DEWEY : |
669 |
ISSN : |
1359-6454 |
En ligne : |
http://www.sciencedirect.com/science/article/pii/S1359645410000480 |
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