Documents disponibles écrits par cet auteur

Broadband anti-reflection and enhanced field emission from catalyst-free grown small-sized ITO nanowires at a low temperature / Neng Wan in Acta materialia, Vol. 58 N° 8 (Mai 2010) 

Public ISBD [article]  in Acta materialia > Vol. 58 N° 8 (Mai 2010) . - pp. 3068–3072 Titre : Broadband anti-reflection and enhanced field emission from catalyst-free grown small-sized ITO nanowires at a low temperature Type de document : texte imprimé Auteurs : Neng Wan, Auteur ; Jun Xu, Auteur ; Guran Chen, Auteur Année de publication : 2011 Article en page(s) : pp. 3068–3072 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : ITO  Nanostructure  e-Beam  evaporation  Field  emission  Anti-reflection Résumé : Small-sized indium tin oxide (ITO) nanowires were fabricated using the electron beam evaporation (EBE) technique at low temperature (∼150 °C) without adding any catalyst. The ITO nanowires have a typical diameter of around 10 nm and a length of more than 100 nm, with body-centered cubic crystal structures that grow along the 〈1 0 0〉 directions, as revealed by transmission electron microscopy. The growth mechanism of the branched ITO nanowires was found to be a vapor–solid process. The nanowire films show a broadband anti-reflection property due to the graded refraction index from the film surface to the substrate. Enhanced field emission properties with a low turn-on electric field and a high field enhancement factor were also observed in the ITO nanowires. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645410000558 [article] Broadband anti-reflection and enhanced field emission from catalyst-free grown small-sized ITO nanowires at a low temperature [texte imprimé] / Neng Wan, Auteur ; Jun Xu, Auteur ; Guran Chen, Auteur . - 2011 . - pp. 3068–3072. Métallurgie Langues : Anglais (eng) in Acta materialia > Vol. 58 N° 8 (Mai 2010) . - pp. 3068–3072 Mots-clés : ITO  Nanostructure  e-Beam  evaporation  Field  emission  Anti-reflection Résumé : Small-sized indium tin oxide (ITO) nanowires were fabricated using the electron beam evaporation (EBE) technique at low temperature (∼150 °C) without adding any catalyst. The ITO nanowires have a typical diameter of around 10 nm and a length of more than 100 nm, with body-centered cubic crystal structures that grow along the 〈1 0 0〉 directions, as revealed by transmission electron microscopy. The growth mechanism of the branched ITO nanowires was found to be a vapor–solid process. The nanowire films show a broadband anti-reflection property due to the graded refraction index from the film surface to the substrate. Enhanced field emission properties with a low turn-on electric field and a high field enhancement factor were also observed in the ITO nanowires. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645410000558

Fault detection and isolation of nonlinear systems / Jun Xu in Transactions of the ASME . Journal of dynamic systems, measurement, and control, Vol. 134 N° 4 (Juillet 2012) 

Public ISBD [article]  in Transactions of the ASME . Journal of dynamic systems, measurement, and control > Vol. 134 N° 4 (Juillet 2012) . - 07 p. Titre : Fault detection and isolation of nonlinear systems : an unknown input observer approach with sum-of-squares techniques Type de document : texte imprimé Auteurs : Jun Xu, Auteur ; Kai-Yew Lum, Auteur ; Lihua Xie, Auteur Année de publication : 2012 Article en page(s) : 07 p. Note générale : Dynamic systems Langues : Anglais (eng) Mots-clés : Novel  nonlinear  unknown  input  observer  (UIO)  Fault  detection  and  isolation  (FDI)  Sum-of-squares  (SOS)  theory  Lie  geometry Index. décimale : 629.8 Résumé : This paper presents a novel nonlinear unknown input observer (UIO) design method for fault detection and isolation (FDI) of a class of nonlinear affine systems. By using sum-of-squares (SOS) theory and Lie geometry as the main tools, we demonstrate how to relax the rank constraint in the traditional UIO approach and simplify the design procedure, especially for the polynomial nonlinear systems. Meanwhile, we show that the detection and isolation thresholds based on the L2 gains can be easily obtained via optimization formulated in terms of SOS. Simulation examples are given to illustrate the design procedure and the advantages. DEWEY : 629.8 ISSN : 0022-0434 En ligne : http://asmedl.org/getabs/servlet/GetabsServlet?prog=normal&id=JDSMAA000134000004 [...] [article] Fault detection and isolation of nonlinear systems : an unknown input observer approach with sum-of-squares techniques [texte imprimé] / Jun Xu, Auteur ; Kai-Yew Lum, Auteur ; Lihua Xie, Auteur . - 2012 . - 07 p. Dynamic systems Langues : Anglais (eng) in Transactions of the ASME . Journal of dynamic systems, measurement, and control > Vol. 134 N° 4 (Juillet 2012) . - 07 p. Mots-clés : Novel  nonlinear  unknown  input  observer  (UIO)  Fault  detection  and  isolation  (FDI)  Sum-of-squares  (SOS)  theory  Lie  geometry Index. décimale : 629.8 Résumé : This paper presents a novel nonlinear unknown input observer (UIO) design method for fault detection and isolation (FDI) of a class of nonlinear affine systems. By using sum-of-squares (SOS) theory and Lie geometry as the main tools, we demonstrate how to relax the rank constraint in the traditional UIO approach and simplify the design procedure, especially for the polynomial nonlinear systems. Meanwhile, we show that the detection and isolation thresholds based on the L2 gains can be easily obtained via optimization formulated in terms of SOS. Simulation examples are given to illustrate the design procedure and the advantages. DEWEY : 629.8 ISSN : 0022-0434 En ligne : http://asmedl.org/getabs/servlet/GetabsServlet?prog=normal&id=JDSMAA000134000004 [...]