Les Inscriptions à la Bibliothèque sont ouvertes en
ligne via le site: https://biblio.enp.edu.dz
Les Réinscriptions se font à :
• La Bibliothèque Annexe pour les étudiants en
2ème Année CPST
• La Bibliothèque Centrale pour les étudiants en Spécialités
A partir de cette page vous pouvez :
Retourner au premier écran avec les recherches... |
Détail de l'auteur
Auteur N.A. Morley
Documents disponibles écrits par cet auteur
Affiner la rechercheAn investigation of the effect of structural order on magnetostriction and magnetic behavior of Fe–Ga alloy thin films / A. Javed in Acta materialia, Vol. 58 N° 11 (Juin 2010)
[article]
in Acta materialia > Vol. 58 N° 11 (Juin 2010) . - pp. 4003–4011
Titre : An investigation of the effect of structural order on magnetostriction and magnetic behavior of Fe–Ga alloy thin films Type de document : texte imprimé Auteurs : A. Javed, Auteur ; T. Szumiata, Auteur ; N.A. Morley, Auteur Année de publication : 2011 Article en page(s) : pp. 4003–4011 Note générale : Métallurgie Langues : Anglais (eng) Mots-clés : Fe–Ga alloy Thin films Growth parameters CEMS Magnetostriction Résumé : This paper reports results from a comprehensive study of Fe–Ga films fabricated over a wide range of growth conditions. Polycrystalline Fe100−xGax films (14 ⩽ x ⩽ 32) were deposited (using three different combinations of growth parameters) on Si(1 0 0) using a co-sputtering and evaporation technique. The growth parameters (sputter power, Ga evaporation rate and chamber pressure) were used primarily to control the Fe:Ga ratio in the films. X-ray diffraction showed that all films had 〈1 1 0〉 crystallographic texture normal to the film plane. The lattice parameter increased with % Ga up to x = 22 and was independent of growth parameters. Conversion electron Mössbauer spectroscopy studies showed a predominance of the disordered A2 phase in all films. It appears that the use of vacuum deposition with appropriate parameters can effectively suppress the D03 ordered phase. Systematic studies of the effective magnetostriction constant as a function of composition support this conclusion. It was found that films of high effective saturation magnetostriction constant and low stress could be fabricated using low Ar pressure, irrespective of sputter power or evaporation rate, giving properties useful for application in microelectromechanical systems. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645410001680 [article] An investigation of the effect of structural order on magnetostriction and magnetic behavior of Fe–Ga alloy thin films [texte imprimé] / A. Javed, Auteur ; T. Szumiata, Auteur ; N.A. Morley, Auteur . - 2011 . - pp. 4003–4011.
Métallurgie
Langues : Anglais (eng)
in Acta materialia > Vol. 58 N° 11 (Juin 2010) . - pp. 4003–4011
Mots-clés : Fe–Ga alloy Thin films Growth parameters CEMS Magnetostriction Résumé : This paper reports results from a comprehensive study of Fe–Ga films fabricated over a wide range of growth conditions. Polycrystalline Fe100−xGax films (14 ⩽ x ⩽ 32) were deposited (using three different combinations of growth parameters) on Si(1 0 0) using a co-sputtering and evaporation technique. The growth parameters (sputter power, Ga evaporation rate and chamber pressure) were used primarily to control the Fe:Ga ratio in the films. X-ray diffraction showed that all films had 〈1 1 0〉 crystallographic texture normal to the film plane. The lattice parameter increased with % Ga up to x = 22 and was independent of growth parameters. Conversion electron Mössbauer spectroscopy studies showed a predominance of the disordered A2 phase in all films. It appears that the use of vacuum deposition with appropriate parameters can effectively suppress the D03 ordered phase. Systematic studies of the effective magnetostriction constant as a function of composition support this conclusion. It was found that films of high effective saturation magnetostriction constant and low stress could be fabricated using low Ar pressure, irrespective of sputter power or evaporation rate, giving properties useful for application in microelectromechanical systems. DEWEY : 669 ISSN : 1359-6454 En ligne : http://www.sciencedirect.com/science/article/pii/S1359645410001680