[article]
| Titre : |
Thermal stability of nanocomposite metals : In situ observation of anomalous residual stress relaxation during annealing under synchrotron radiation |
| Type de document : |
texte imprimé |
| Auteurs : |
J. B. Dubois, Auteur ; L. Thilly, Auteur ; P.O. Renault, Auteur |
| Année de publication : |
2011 |
| Article en page(s) : |
pp. 6504–6512 |
| Note générale : |
Métallurgie |
| Langues : |
Anglais (eng) |
| Mots-clés : |
Nanostructures In situ annealing Residual stresses X-ray diffraction Synchrotron |
| Résumé : |
The thermal stability of nanocomposite metals (a nanostructured copper matrix embedding niobium nanotubes) is investigated via time-resolved in situ annealing under synchrotron high-energy X-rays. The diffraction peak profile analysis demonstrates that internal-stress relaxation begins in the Nb nanotubes at a temperature far below the bulk recrystallization temperature and follows size-specific regimes originating from a proximity effect with the nanostructured Cu matrix: the increased Cu–Nb interface surface disrupts internal-stress relaxation processes, confirming the larger thermal resistance of nanostructured materials. |
| DEWEY : |
669 |
| ISSN : |
1359-6454 |
| En ligne : |
http://www.sciencedirect.com/science/article/pii/S1359645410005276 |
in Acta materialia > Vol. 58 N° 19 (Novembre 2010) . - pp. 6504–6512
[article] Thermal stability of nanocomposite metals : In situ observation of anomalous residual stress relaxation during annealing under synchrotron radiation [texte imprimé] / J. B. Dubois, Auteur ; L. Thilly, Auteur ; P.O. Renault, Auteur . - 2011 . - pp. 6504–6512. Métallurgie Langues : Anglais ( eng) in Acta materialia > Vol. 58 N° 19 (Novembre 2010) . - pp. 6504–6512
| Mots-clés : |
Nanostructures In situ annealing Residual stresses X-ray diffraction Synchrotron |
| Résumé : |
The thermal stability of nanocomposite metals (a nanostructured copper matrix embedding niobium nanotubes) is investigated via time-resolved in situ annealing under synchrotron high-energy X-rays. The diffraction peak profile analysis demonstrates that internal-stress relaxation begins in the Nb nanotubes at a temperature far below the bulk recrystallization temperature and follows size-specific regimes originating from a proximity effect with the nanostructured Cu matrix: the increased Cu–Nb interface surface disrupts internal-stress relaxation processes, confirming the larger thermal resistance of nanostructured materials. |
| DEWEY : |
669 |
| ISSN : |
1359-6454 |
| En ligne : |
http://www.sciencedirect.com/science/article/pii/S1359645410005276 |
|