Effect of aluminum on the corrosion resistance of low-alloy steel in 10 wt% sulfuric acid solution / N. D. Nam in Materials and corrosion, Vol. 63 N° 11 (Novembre 2012)  

Public ISBD [article]  inMaterials and corrosion > Vol. 63 N° 11 (Novembre 2012) . - pp. 1004–1010 Titre : Effect of aluminum on the corrosion resistance of low-alloy steel in 10 wt% sulfuric acid solution Type de document : texte imprimé Auteurs : N. D. Nam, Auteur ; W. C. Kim, Auteur ; J.-G. Kim, Auteur Année de publication : 2014 Article en page(s) : pp. 1004–1010 Note générale : Génie mécanique Langues : Anglais (eng) Mots-clés : Acid corrosion  aluminum  electrochemical impedance spectroscopy  low-alloy steel  potentiodynamic Résumé : The aqueous corrosion behavior of low-alloy steel with aluminum contents was examined in a 10 wt% H2SO4 (pH 0.13) solution using electrochemical techniques and surface analyses. The corrosion resistance of the new alloy steel was evaluated in terms of electrochemical parameters, such as passive current density, film, and charge transfer resistances. The results showed that a high Al content in the steel imparted better passivation behavior resulting in a lower corrosion rate. It related to the enrichment of iron carbonate and hydrocarbon by the dissolution of the carbide phase. En ligne : http://onlinelibrary.wiley.com/doi/10.1002/maco.201106351/abstract [article] Effect of aluminum on the corrosion resistance of low-alloy steel in 10 wt% sulfuric acid solution [texte imprimé] / N. D. Nam, Auteur ; W. C. Kim, Auteur ; J.-G. Kim, Auteur . - 2014 . - pp. 1004–1010. Génie mécanique Langues : Anglais (eng) in Materials and corrosion > Vol. 63 N° 11 (Novembre 2012) . - pp. 1004–1010 Mots-clés : Acid corrosion  aluminum  electrochemical impedance spectroscopy  low-alloy steel  potentiodynamic Résumé : The aqueous corrosion behavior of low-alloy steel with aluminum contents was examined in a 10 wt% H2SO4 (pH 0.13) solution using electrochemical techniques and surface analyses. The corrosion resistance of the new alloy steel was evaluated in terms of electrochemical parameters, such as passive current density, film, and charge transfer resistances. The results showed that a high Al content in the steel imparted better passivation behavior resulting in a lower corrosion rate. It related to the enrichment of iron carbonate and hydrocarbon by the dissolution of the carbide phase. En ligne : http://onlinelibrary.wiley.com/doi/10.1002/maco.201106351/abstract

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Order-lot pegging for minimizing total tardiness in semiconductor wafer fabrication process / J.-G. Kim in Journal of the operational research society (JORS), Vol. 63 N° 9 (Septembre 2012)  

Public ISBD [article]  inJournal of the operational research society (JORS) > Vol. 63 N° 9 (Septembre 2012) . - pp. 1258–1270 Titre : Order-lot pegging for minimizing total tardiness in semiconductor wafer fabrication process Type de document : texte imprimé Auteurs : J.-G. Kim, Auteur ; S.-K. Lim, Auteur Année de publication : 2012 Article en page(s) : pp. 1258–1270 Note générale : Operational research Langues : Anglais (eng) Mots-clés : Order-lot pegging Search heuristics Semiconductor wafer fabrication Index. décimale : 001.424 Résumé : We consider a problem of order-lot pegging in semiconductor wafer fabrication process. In the problem, we determine an assignment of wafers in lots to orders and a plan for input release of wafers into a wafer fabrication facility with the objective of minimizing total tardiness of the orders over a finite time horizon. The problem is formulated as a mixed integer linear program and proved to be strongly NP-hard. We find properties for an optimal order-lot assignment of the problem and develop a pegging method based on the properties. Also, we prove that an optimal order-lot assignment can be obtained by finding an optimal order sequence of assigning wafers to orders when using the pegging method developed in this study. In addition, we suggest two search heuristic algorithms for finding the optimal order sequence of assigning wafers to orders. The test results on randomly generated problems show that the suggested algorithms work fairly well compared to the commercial optimization software package and solve industrial-sized problems in a reasonable amount of time. DEWEY : 001.424 ISSN : 0160-5682 En ligne : http://www.palgrave-journals.com/jors/journal/v63/n9/abs/jors2011133a.html [article] Order-lot pegging for minimizing total tardiness in semiconductor wafer fabrication process [texte imprimé] / J.-G. Kim, Auteur ; S.-K. Lim, Auteur . - 2012 . - pp. 1258–1270. Operational research Langues : Anglais (eng) in Journal of the operational research society (JORS) > Vol. 63 N° 9 (Septembre 2012) . - pp. 1258–1270 Mots-clés : Order-lot pegging Search heuristics Semiconductor wafer fabrication Index. décimale : 001.424 Résumé : We consider a problem of order-lot pegging in semiconductor wafer fabrication process. In the problem, we determine an assignment of wafers in lots to orders and a plan for input release of wafers into a wafer fabrication facility with the objective of minimizing total tardiness of the orders over a finite time horizon. The problem is formulated as a mixed integer linear program and proved to be strongly NP-hard. We find properties for an optimal order-lot assignment of the problem and develop a pegging method based on the properties. Also, we prove that an optimal order-lot assignment can be obtained by finding an optimal order sequence of assigning wafers to orders when using the pegging method developed in this study. In addition, we suggest two search heuristic algorithms for finding the optimal order sequence of assigning wafers to orders. The test results on randomly generated problems show that the suggested algorithms work fairly well compared to the commercial optimization software package and solve industrial-sized problems in a reasonable amount of time. DEWEY : 001.424 ISSN : 0160-5682 En ligne : http://www.palgrave-journals.com/jors/journal/v63/n9/abs/jors2011133a.html

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