Article : texte imprimé

Modeling piezoresponse force microscopy for low-dimensional material characterization : theory and experiment

Amin Salehi-Khojin, Auteur ; Saeid Bashash, Auteur ; Jalili, Nader, Auteur |

Dans Transactions of the ASME . Journal of dynamic systems, measurement, and control (Vol. 131 N° 6, Novembre 2009)

Piezoresponse force microscopy (PFM) is an atomic force microscopy-based approach utilized for measuring local properties of piezoelectric materials. The objective of this study is to propose a practical framework for simultaneous estimation of [...]

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