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Application of micro-X-ray fluorescence analysis for the characterization of industrial wastes / Maria D. Alba in Industrial & engineering chemistry research, Vol. 49 N° 5 (Mars 2010) 

Public ISBD [article]  in Industrial & engineering chemistry research > Vol. 49 N° 5 (Mars 2010) . - pp. 2348–2352 Titre : Application of micro-X-ray fluorescence analysis for the characterization of industrial wastes Type de document : texte imprimé Auteurs : Maria D. Alba, Auteur ; Patricia Aparicio, Auteur ; Jose M. Benítez, Auteur Année de publication : 2010 Article en page(s) : pp. 2348–2352 Note générale : Industrial Chemistry Langues : Anglais (eng) Mots-clés : X-ray;  Industrial  wastes Résumé : The issue of how to improve product quality and product yield in a short period of time is becoming more critical in many industries. Thus, shorter delay times between laboratory analysis and process correction are important in process control. Elimination of sample handling and operator manipulation is desirable. The present article proposes micro-X-ray fluorescence (μXRF) as an economical control method for industrial product quality with a minimum time cost. Samples from different industrial processes have been chosen and analyzed by XRF and μXRF. The results show that the two techniques give similar results and that μXRF allows the waste to be classified and is able to detect problems in the production process. Note de contenu : Bibliogr. ISSN : 0888-5885 En ligne : http://pubs.acs.org/doi/abs/10.1021/ie901716w [article] Application of micro-X-ray fluorescence analysis for the characterization of industrial wastes [texte imprimé] / Maria D. Alba, Auteur ; Patricia Aparicio, Auteur ; Jose M. Benítez, Auteur . - 2010 . - pp. 2348–2352. Industrial Chemistry Langues : Anglais (eng) in Industrial & engineering chemistry research > Vol. 49 N° 5 (Mars 2010) . - pp. 2348–2352 Mots-clés : X-ray;  Industrial  wastes Résumé : The issue of how to improve product quality and product yield in a short period of time is becoming more critical in many industries. Thus, shorter delay times between laboratory analysis and process correction are important in process control. Elimination of sample handling and operator manipulation is desirable. The present article proposes micro-X-ray fluorescence (μXRF) as an economical control method for industrial product quality with a minimum time cost. Samples from different industrial processes have been chosen and analyzed by XRF and μXRF. The results show that the two techniques give similar results and that μXRF allows the waste to be classified and is able to detect problems in the production process. Note de contenu : Bibliogr. ISSN : 0888-5885 En ligne : http://pubs.acs.org/doi/abs/10.1021/ie901716w