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Effet of frequency on the substrate current in MOS devices

Arezki Benfdila, Auteur ; Ved Mitra, Directeur de thèse | Institut National d'Electricité et d'Electronique INELEC | 1992

Control of the electrical properties of the MOS (Metal Oxide Semiconductor) systems has been one of the major factors that has led to stable and high performance integrated circuits. The MOS capacitor (or MOS Diode) is used in both monitoring i[...]

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