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Combining self-explaining with computer architecture diagrams to enhance the learning of assembly language programming / Yen-Chu Hung in IEEE transactions on education, Vol. 55 N° 4 (Novembre 2012) 

Public ISBD [article]  in IEEE transactions on education > Vol. 55 N° 4 (Novembre 2012) . - pp. 546 - 551 Titre : Combining self-explaining with computer architecture diagrams to enhance the learning of assembly language programming Type de document : texte imprimé Auteurs : Yen-Chu Hung, Auteur Année de publication : 2013 Article en page(s) : pp. 546 - 551 Note générale : Education Langues : Anglais (eng) Mots-clés : Assembly  language  programming  Computer  architecture  Diagrams  method  Programming  Self-explaining  (SE) Résumé : This paper investigates the impact of combining self explaining (SE) with computer architecture diagrams to help novice students learn assembly language programming. Pre- and post-test scores for the experimental and control groups were compared and subjected to covariance (ANCOVA) statistical analysis. Results indicate that the SE-plus-diagram approach had a significant effect on student achievement and improved novice students' learning experience by increasing their interest and participation in the course and helping them to develop assembly programming skills. ISSN : 0018-9359 En ligne : http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6194980&sortType%3Das [...] [article] Combining self-explaining with computer architecture diagrams to enhance the learning of assembly language programming [texte imprimé] / Yen-Chu Hung, Auteur . - 2013 . - pp. 546 - 551. Education Langues : Anglais (eng) in IEEE transactions on education > Vol. 55 N° 4 (Novembre 2012) . - pp. 546 - 551 Mots-clés : Assembly  language  programming  Computer  architecture  Diagrams  method  Programming  Self-explaining  (SE) Résumé : This paper investigates the impact of combining self explaining (SE) with computer architecture diagrams to help novice students learn assembly language programming. Pre- and post-test scores for the experimental and control groups were compared and subjected to covariance (ANCOVA) statistical analysis. Results indicate that the SE-plus-diagram approach had a significant effect on student achievement and improved novice students' learning experience by increasing their interest and participation in the course and helping them to develop assembly programming skills. ISSN : 0018-9359 En ligne : http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6194980&sortType%3Das [...]