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Scanning electron microscopy measurements of the surface roughness of paper / Sujit Banerjee in Industrial & engineering chemistry research, Vol. 48 N° 9 (Mai 2009) 

Public ISBD [article]  in Industrial & engineering chemistry research > Vol. 48 N° 9 (Mai 2009) . - pp. 4322–4325 Titre : Scanning electron microscopy measurements of the surface roughness of paper Type de document : texte imprimé Auteurs : Sujit Banerjee, Auteur ; Yang, Rallming, Auteur ; Charles E. Courchene, Auteur Année de publication : 2009 Article en page(s) : pp. 4322–4325 Note générale : Chemical engineering Langues : Anglais (eng) Mots-clés : Paper  sheet  X-y  uniformity  Roughness  Scanning  electron  microscopy Résumé : A new approach to the measurement of x−y uniformity of the surface of a paper sheet is described. Scanning electron micrographs are taken of both the top and bottom surfaces of a paper sheet and image-analyzed. The images were converted to grayscale, and the standard deviation of the pixel brightness was called the “SEM roughness index” and calculated for each surface. Both commercial newsprint sheets and handsheets made with kraft, TMP, and recycled fibers were examined. Debonders and cationic polymers were added to some sheets. The addition of debonders increases the index on the top side of the sheet but decreases it on the bottom. This is caused by the movement of fines from the top to the bottom side. The addition of cationic polymers increases the SEM roughness index by increasing the degree of microfloc formation. Samples taken across a reel from a commercial paper machine tend to show a mirror image relationship between the top and bottom surfaces. The SEM roughness index is able to detect subtle changes in sheet structure caused by differences in the mode of addition of polymers used for retaining fines in the sheet. En ligne : http://pubs.acs.org/doi/abs/10.1021/ie900029v [article] Scanning electron microscopy measurements of the surface roughness of paper [texte imprimé] / Sujit Banerjee, Auteur ; Yang, Rallming, Auteur ; Charles E. Courchene, Auteur . - 2009 . - pp. 4322–4325. Chemical engineering Langues : Anglais (eng) in Industrial & engineering chemistry research > Vol. 48 N° 9 (Mai 2009) . - pp. 4322–4325 Mots-clés : Paper  sheet  X-y  uniformity  Roughness  Scanning  electron  microscopy Résumé : A new approach to the measurement of x−y uniformity of the surface of a paper sheet is described. Scanning electron micrographs are taken of both the top and bottom surfaces of a paper sheet and image-analyzed. The images were converted to grayscale, and the standard deviation of the pixel brightness was called the “SEM roughness index” and calculated for each surface. Both commercial newsprint sheets and handsheets made with kraft, TMP, and recycled fibers were examined. Debonders and cationic polymers were added to some sheets. The addition of debonders increases the index on the top side of the sheet but decreases it on the bottom. This is caused by the movement of fines from the top to the bottom side. The addition of cationic polymers increases the SEM roughness index by increasing the degree of microfloc formation. Samples taken across a reel from a commercial paper machine tend to show a mirror image relationship between the top and bottom surfaces. The SEM roughness index is able to detect subtle changes in sheet structure caused by differences in the mode of addition of polymers used for retaining fines in the sheet. En ligne : http://pubs.acs.org/doi/abs/10.1021/ie900029v