[article]
Titre : |
Solid-state NMR characterization of silicon nitride bonded silicon carbide refractories |
Type de document : |
texte imprimé |
Auteurs : |
Zoran D. Zujovic, Auteur ; Ronny Etzion, Auteur ; James B. Metson, Auteur |
Année de publication : |
2009 |
Article en page(s) : |
p. 9913–9918 |
Note générale : |
Industrial chemistry |
Langues : |
Anglais (eng) |
Mots-clés : |
Silicon Nitride X-ray |
Résumé : |
Solid-state 29Si NMR spectroscopy and X-ray diffraction have been used to analyze commercial samples of silicon nitride bonded silicon carbide (SNBSC) refractories. Spectra of samples before and after exposure to aluminum electrolysis conditions from the peripheral and core parts of as manufactured SNBSC bricks from two different refractory producers are presented. The quantitative analysis of SiC/Si3N4 and α-Si3N4/β-Si3N4 using NMR is complicated due to the fact that SNBSC can contain paramagnetic impurities. Thus, from the NMR data, these ratios can only be tentatively estimated. It is shown that in order to achieve a comprehensive understanding of the microstructure of SNBSC materials, a combination of NMR and X-ray diffraction methods should be applied. |
En ligne : |
http://pubs.acs.org/doi/abs/10.1021/ie800759c |
in Industrial & engineering chemistry research > Vol. 47 n°24 (Décembre 2008) . - p. 9913–9918
[article] Solid-state NMR characterization of silicon nitride bonded silicon carbide refractories [texte imprimé] / Zoran D. Zujovic, Auteur ; Ronny Etzion, Auteur ; James B. Metson, Auteur . - 2009 . - p. 9913–9918. Industrial chemistry Langues : Anglais ( eng) in Industrial & engineering chemistry research > Vol. 47 n°24 (Décembre 2008) . - p. 9913–9918
Mots-clés : |
Silicon Nitride X-ray |
Résumé : |
Solid-state 29Si NMR spectroscopy and X-ray diffraction have been used to analyze commercial samples of silicon nitride bonded silicon carbide (SNBSC) refractories. Spectra of samples before and after exposure to aluminum electrolysis conditions from the peripheral and core parts of as manufactured SNBSC bricks from two different refractory producers are presented. The quantitative analysis of SiC/Si3N4 and α-Si3N4/β-Si3N4 using NMR is complicated due to the fact that SNBSC can contain paramagnetic impurities. Thus, from the NMR data, these ratios can only be tentatively estimated. It is shown that in order to achieve a comprehensive understanding of the microstructure of SNBSC materials, a combination of NMR and X-ray diffraction methods should be applied. |
En ligne : |
http://pubs.acs.org/doi/abs/10.1021/ie800759c |
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