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Détail de l'auteur
Auteur Ronny Etzion
Documents disponibles écrits par cet auteur
Affiner la rechercheSolid-state NMR characterization of silicon nitride bonded silicon carbide refractories / Zoran D. Zujovic ; Ronny Etzion ; James B. Metson in Industrial & engineering chemistry research, Vol. 47 n°24 (Décembre 2008)
[article]
in Industrial & engineering chemistry research > Vol. 47 n°24 (Décembre 2008) . - p. 9913–9918
Titre : Solid-state NMR characterization of silicon nitride bonded silicon carbide refractories Type de document : texte imprimé Auteurs : Zoran D. Zujovic, Auteur ; Ronny Etzion, Auteur ; James B. Metson, Auteur Année de publication : 2009 Article en page(s) : p. 9913–9918 Note générale : Industrial chemistry Langues : Anglais (eng) Mots-clés : Silicon Nitride X-ray Résumé : Solid-state 29Si NMR spectroscopy and X-ray diffraction have been used to analyze commercial samples of silicon nitride bonded silicon carbide (SNBSC) refractories. Spectra of samples before and after exposure to aluminum electrolysis conditions from the peripheral and core parts of as manufactured SNBSC bricks from two different refractory producers are presented. The quantitative analysis of SiC/Si3N4 and α-Si3N4/β-Si3N4 using NMR is complicated due to the fact that SNBSC can contain paramagnetic impurities. Thus, from the NMR data, these ratios can only be tentatively estimated. It is shown that in order to achieve a comprehensive understanding of the microstructure of SNBSC materials, a combination of NMR and X-ray diffraction methods should be applied. En ligne : http://pubs.acs.org/doi/abs/10.1021/ie800759c [article] Solid-state NMR characterization of silicon nitride bonded silicon carbide refractories [texte imprimé] / Zoran D. Zujovic, Auteur ; Ronny Etzion, Auteur ; James B. Metson, Auteur . - 2009 . - p. 9913–9918.
Industrial chemistry
Langues : Anglais (eng)
in Industrial & engineering chemistry research > Vol. 47 n°24 (Décembre 2008) . - p. 9913–9918
Mots-clés : Silicon Nitride X-ray Résumé : Solid-state 29Si NMR spectroscopy and X-ray diffraction have been used to analyze commercial samples of silicon nitride bonded silicon carbide (SNBSC) refractories. Spectra of samples before and after exposure to aluminum electrolysis conditions from the peripheral and core parts of as manufactured SNBSC bricks from two different refractory producers are presented. The quantitative analysis of SiC/Si3N4 and α-Si3N4/β-Si3N4 using NMR is complicated due to the fact that SNBSC can contain paramagnetic impurities. Thus, from the NMR data, these ratios can only be tentatively estimated. It is shown that in order to achieve a comprehensive understanding of the microstructure of SNBSC materials, a combination of NMR and X-ray diffraction methods should be applied. En ligne : http://pubs.acs.org/doi/abs/10.1021/ie800759c