Auteur Azzedine Bellel
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Documents disponibles écrits par cet auteur (1)
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Silicon wafers have been implanted with 400 keV molecular oxygen, with a dose of 1.8 x 10¹⁸ O⁺/cm² at an implantation temperature of about 500°C. The wafers were annealed at 1200°C for 2 hours with SiO₂ cap. Rutherford backscattering has been [...]


