Measuring the thermal conductivity of porous, transparent SiO2 films with time domain thermoreflectance / Patrick E. Hopkins in Journal of heat transfer, Vol. 133 N° 6 (Juin 2011)  

Measuring the thermal conductivity of porous, transparent SiO2 films with time domain thermoreflectance [texte imprimé] / Patrick E. Hopkins, Auteur ; Bryan Kaehr, Auteur ; Leslie M. Phinney, Auteur . - 2011 . - pp. [061601/1-8].
Physique
Langues : Anglais (eng)
in Journal of heat transfer > Vol. 133 N° 6 (Juin 2011) . - pp. [061601/1-8]

Mots-clés :	Time domain thermoreflectance Thermal conductivity Differentail-effective medium theory Porous SiO2
Index. décimale :	536 Chaleur. Thermodynamique
Résumé :	Nanocomposites offer unique capabilities of controlling thermal transport through the manipulation of various structural aspects of the material. However, measurements of the thermal properties of these composites are often difficult, especially porous nanomaterials. Optical measurements of these properties, although ideal due to the noncontact nature, are challenging due to the large surface variability of nanoporous structures. In this work, we use a vector-based thermal algorithm to solve for the temperature change and heat transfer in which a thin film subjected to a modulated heat source is sandwiched between two thermally conductive pathways. We validate our solution with time domain thermoreflectance measurements on glass slides and extend the thermal conductivity measurements to SiO2-based nanostructured films.
DEWEY :	536
ISSN :	0022-1481
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